The Yokogawa Ando AQ7410 is a Michelson interferometer based high-resolution reflectometer. It produces high spatial resolution (20 Microm) for 1310 nm and 1550 nm. The measurement distance has dramatically increased, up to 2000 mm in air. Its dynamic range of?10 to 85 dB?for return loss measurement is impressive as well.

The AQ7410 features:

Spatial resolution of 20 Microm at 1.31 Microm
Achieves high-sensitivity measurement at 1.31 Microm
Does not require adjustment of a polarization controller
Maximum measurement distance: 2.0 m (in air)
When using AQ7412 ASE source, it can be used for evaluation of DWDM components in accordance with ITU-T grid for tunable wavelength center.
Achieves very high sensitivity measurement (more than 90 dB in dynamic range)
Measures loss/reflection distribution of optical waveguides, such as PLC
Measures inner reflection distribution of an optical module
Measures return loss of optical connectorsMeasures DWDM components according to ITU-grid center wavelength
The AQ7410 can be coupled with both LED sources and ASE sources such as the AQ7412, AQ7413 and AQ7414. These units are sold separay. Contact Test Equipment Connection for details.